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Manual Probe System - List of Manufacturers, Suppliers, Companies and Products

Manual Probe System Product List

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200mm Manual Probe System 'WL-170-THZ'

200mm Manual Probe System 'WL-170-THZ'

Signatone's probe systems offer high reliability recognized by the industry, suitable for various measurement applications.

We offer the Signatone 200mm manual probe system 'WL-170-THZ' equipped with a "large area positioner" on a widely enhanced platen. It is capable of RF/mmW, DC, IV-CV, and high power test measurements. It supports various differential/broadband frequency extenders and automatic impedance tuners. With robust design and seamless integration of extenders/tuners, it can accommodate a variety of measurement applications for multi-use. The system features easy operation, allowing quick movements and fine adjustments with a one-handed XY stage knob. Additionally, the quick platen lift enables separation adjustment and micro-rotation locking of the chuck. Options include equipment racks, vibration isolation tables, and thermal chucks. Please feel free to consult us if you have any requests. *For more details, please download the PDF or feel free to contact us.

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200mm Manual Probe System 'WL-170'

200mm Manual Probe System 'WL-170'

Supports various on-wafer analysis measurement applications, Signatone probe system.

The "WL-170" is a 200mm manual probe system that performs accurate RF, DC, IV-CV, and high-power test measurements with high reliability. It can be configured in multiple ways with chuck options, micro-positioners for DC/RF/high power, microscopes, cameras, PCB holders, and more. Additionally, optional items such as equipment racks, vibration isolation tables, and thermal chucks are also available. *For more details, please download the PDF or feel free to contact us.

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150mm-200mm Manual Probe System 'WL-1160'

150mm-200mm Manual Probe System 'WL-1160'

High reliability and accurate RF/mmW, DC, IV-CV, high power test measurements Signatone probe system.

We offer the manual probe system 'WL-1160' equipped with a steel platen compatible with magnetic or vacuum suction, or fixed RF/DC/HP positioners, with a range of 150mm-200mm. With a robust design and multiple setup and configuration options, it can accommodate various applications. It can be used for a wide range of RF/DC/HP testing. Additionally, quick movement and fine adjustments are possible with the XY stage knob that can be operated with one hand. 【Example Configuration】 - Quick platen lift for platen separation adjustment, chuck micro-rotation, and locking - Multiple configurations available with chuck options, DC/RF/1-10KV micro-positioners, microscopes, cameras, PCB holders, etc. - Instrument racks, vibration isolation tables, thermal chucks, dark boxes, etc., are also available (optional). *For more details, please download the PDF or feel free to contact us.

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150mm-200mm Manual Probe System 'WL-1160'

150mm-200mm Manual Probe System 'WL-1160'

Signatone's probe system for accurate RF/mmW, DC, IV-CV, and high-power testing with high reliability.

We offer the manual probe system 'WL-1160' equipped with a steel platen compatible with magnetic or vacuum suction, or fixed RF/DC/HP positioners, with a range of 150mm-200mm. With a robust design and multiple setup and configuration options, it can accommodate various applications. It is suitable for a wide range of RF/DC/HP testing. Additionally, it features a one-handed operable XY stage knob for quick movements and fine adjustments. 【Example Configuration】 - Quick platen lift for platen separation adjustment, chuck micro-rotation, and locking - Multiple configurations available with chuck options, DC/RF/1-10KV micro-positioners, microscopes, cameras, PCB holders, etc. - Instrument racks, vibration isolation tables, thermal chucks, dark boxes, etc., are also available (optional). *For more details, please download the PDF or feel free to contact us.

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200mm High Precision Manual Probe System 'WL-210-LE'

200mm High Precision Manual Probe System 'WL-210-LE'

Signatone probe system with local enclosure for accurate measurement.

We offer the high-reliability 200mm high-precision manual probe system 'WL-210-LE' with a local enclosure. It supports various applications such as failure analysis (FA), RF and mmW wafer-level reliability, and device characterization. The local enclosure is a high-performance environmental chamber that provides excellent EMI shielding and a light-tight environment, in addition to low noise and superior measurement of low capacitance. 【Features (e.g., Local Enclosure)】 ■ Advanced EMI/RFI/light shielding ■ Low leakage measurement (femtoamperes) ■ Operating temperature: -60°C to +300°C *For more details, please download the PDF or feel free to contact us.

  • Other microscopes

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200mm Manual Probe System 'WL-170-THZ'

200mm Manual Probe System 'WL-170-THZ'

Signatone's probe system, recognized by the industry for its high reliability, supports various measurement applications.

We offer the Signatone 200mm manual probe system 'WL-170-THZ' equipped with a "large area positioner" on a widely reinforced platen. It is capable of RF/mmW, DC, IV-CV, and high power test measurements. It supports a variety of differential/broadband frequency extenders and automatic impedance tuners. With robust design and seamless integration of extenders/tuners, it can accommodate various measurement applications, making it versatile for multiple uses. The system features easy operation, allowing for quick movements and fine adjustments with a one-handed XY stage knob. Additionally, the quick platen lift enables separation adjustment, chuck micro-rotation, and locking of the platen. Options include equipment racks, vibration isolation tables, and thermal chucks. Please feel free to consult us if you have any requests. *For more details, please download the PDF or feel free to contact us.

  • probe

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200mm High Precision Manual Probe System 'WL-210-LE'

200mm High Precision Manual Probe System 'WL-210-LE'

Probe system by Signatone with local enclosure for accurate measurement.

We offer the high-reliability 200mm high-precision manual probe system 'WL-210-LE' with a local enclosure. It supports various applications such as failure analysis (FA), RF and mmW wafer-level reliability, and device characterization. The local enclosure is a high-performance environmental chamber that provides excellent EMI shielding and a light-tight environment, in addition to low noise, making it ideal for low capacitance measurements. 【Features (e.g., Local Enclosure)】 ■ Advanced EMI/RFI/light shielding ■ Low leakage measurements (femtoamperes) ■ Operating temperature: -60°C to +300°C *For more details, please download the PDF or feel free to contact us.

  • probe

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